HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy

HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy

The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (

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Bibliographische Detailangaben
Veröffentlicht in:Ultramicroscopy 2015-12, Vol.159, p.403-412
Hauptverfasser: Lefebvre, W., Hernandez-Maldonado, D., Moyon, F., Cuvilly, F., Vaudolon, C., Shinde, D., Vurpillot, F.
Format: Artikel
Sprache:eng
Schlagworte:
Annular
Atom counting
Atom probe tomography
Atomic force microscopy
Correlation analysis
Correlative microscopy
Counting
Electron probes
HAADF
Physics
Simulation
STEM
Tips
Tomography
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Beschreibung
Zusammenfassung:The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2015.02.011