EBSD‐assisted Laue microdiffraction for microstrain analysis

The X‐ray Laue microdiffraction (µLaue) technique has been establishing itself as a reliable means for microstrain analysis for the past few decades. One problem with this technique is that when the crystal size is significantly smaller than the probed volume and when the diffracting crystals are closely oriented, a large number of individual µLaue patterns are superimposed in a complex way on the recorded diffraction images. In that case, because of the difficulty of isolating unambiguously a single‐grain µLaue pattern, a reliable analysis of strains is tedious manually and hardly achievable with current automated methods. This issue is even more severe for low‐symmetry crystals or when high‐energy X‐rays are used, since each single‐crystal µLaue pattern already contains a large number of spots. This paper proposes overcoming this challenge through the development of a combined approach coupling µLaue and electron backscatter diffraction (EBSD). The capabilities of this `EBSD‐assisted µLaue' automated method are illustrated on a monoclinic zirconia‐based specimen and µLaue diffraction patterns are analysed with the crystal orientation input from EBSD. The obtained results are statistically reliable, reproducible and provide a physical insight into the micromechanical characteristics of the material. An electron backscatter diffraction (EBSD)‐assisted X‐ray Laue microdiffraction (µLaue) method has been developed to determine local strain in materials with complex microstructures. The method uses EBSD data on crystal orientation as starting information for a µLaue pattern indexing procedure with template matching. The final determination of strain from the analysis of a µLaue pattern composed of a large number of intricate and closely located peaks becomes possible in an automatic way.