TEM and STEM Observations of a Flat Continuous Silicon-Germanium Thin Film Epitaxially Grown on Porous Silicon

TEM and STEM Observations of a Flat Continuous Silicon-Germanium Thin Film Epitaxially Grown on Porous Silicon

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Veröffentlicht in:Journal of materials science and chemical engineering 2017, Vol.5 (1), p.26-34
Hauptverfasser: Yamanaka, Junji, Usami, Noritaka, Amtablian, Sevak, Fave, Alain, Lemiti, Mustapha, Yamamoto, Chiaya, Nakagawa, Kiyokazu
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container_title Journal of materials science and chemical engineering
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creator Yamanaka, Junji
Usami, Noritaka
Amtablian, Sevak
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Lemiti, Mustapha
Yamamoto, Chiaya
Nakagawa, Kiyokazu
description
doi_str_mv 10.4236/msce.2017.51004
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subjects Engineering Sciences
Materials
title TEM and STEM Observations of a Flat Continuous Silicon-Germanium Thin Film Epitaxially Grown on Porous Silicon
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