A reconfigurable silicon-on-insulator diode with tunable electrostatic doping
P-N diodes can be emulated in ultrathin, fully depleted Silicon-On-Insulator films by appropriately biasing the front and back gates. Adjacent electron and hole populations form a virtual P-N junction. Systematic current-voltage I-V characteristics are presented revealing similarities and major diff...
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Veröffentlicht in: | Journal of applied physics 2017-08, Vol.122 (8) |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | P-N diodes can be emulated in ultrathin, fully depleted Silicon-On-Insulator films by
appropriately biasing the front and back gates. Adjacent electron and hole populations
form a virtual P-N junction. Systematic current-voltage I-V characteristics are presented
revealing similarities and major differences with those of conventional P-N diodes with
ion-implanted doping. The lateral electric field from the anode combines with the
gate-induced vertical field and leads to unusual two-dimensional effects. A distinct merit
of the virtual diode is the possibility to adjust the concentrations of electrostatic
doping via the gates. The reverse current, forward current, and depletion
depth become gate-controlled. Our experiments show that by modifying the type, N or P, of
electrostatic doping, the virtual diode can be reconfigured in 8 other devices:
semi-virtual diodes, PIN diodes, tunneling field-effect transistors or band-modulation
FET. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.4999314 |