A reconfigurable silicon-on-insulator diode with tunable electrostatic doping

P-N diodes can be emulated in ultrathin, fully depleted Silicon-On-Insulator films by appropriately biasing the front and back gates. Adjacent electron and hole populations form a virtual P-N junction. Systematic current-voltage I-V characteristics are presented revealing similarities and major diff...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 2017-08, Vol.122 (8)
Hauptverfasser: Cristoloveanu, Sorin, Lee, Kyung Hwa, Bawedin, Maryline
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:P-N diodes can be emulated in ultrathin, fully depleted Silicon-On-Insulator films by appropriately biasing the front and back gates. Adjacent electron and hole populations form a virtual P-N junction. Systematic current-voltage I-V characteristics are presented revealing similarities and major differences with those of conventional P-N diodes with ion-implanted doping. The lateral electric field from the anode combines with the gate-induced vertical field and leads to unusual two-dimensional effects. A distinct merit of the virtual diode is the possibility to adjust the concentrations of electrostatic doping via the gates. The reverse current, forward current, and depletion depth become gate-controlled. Our experiments show that by modifying the type, N or P, of electrostatic doping, the virtual diode can be reconfigured in 8 other devices: semi-virtual diodes, PIN diodes, tunneling field-effect transistors or band-modulation FET.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4999314