Performance vs. reliability adaptive body bias scheme in 28nm & 14nm UTBB FDSOI nodes

This paper shows the advantages of using body bias. Experiments are performed in 14nm and 28nm UTBB FDSOI transistors and ring oscillators (ROs). The impact of body bias on performance and reliability is highlighted. The body biasing offers significant advantages for adapting the tradeoff between re...

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Veröffentlicht in:Microelectronics and reliability 2016-09, Vol.64, p.158-162
Hauptverfasser: Ndiaye, C., Huard, V., Federspiel, X., Cacho, F., Bravaix, A.
Format: Artikel
Sprache:eng
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Zusammenfassung:This paper shows the advantages of using body bias. Experiments are performed in 14nm and 28nm UTBB FDSOI transistors and ring oscillators (ROs). The impact of body bias on performance and reliability is highlighted. The body biasing offers significant advantages for adapting the tradeoff between reliability and performance in logic circuits without changing the design margins. With FDSOI technology, we have an additional degree of freedom of process variability compensation by using body bias voltage (Adaptive Body Bias, ABB) next to supply voltage compensation used before. We show that ABB compensation technique presents better results for a complete power optimization.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2016.07.085