Analysis of Bias Effects on the Total-Dose Response of a Bipolar Voltage Comparator
The impact of the bias condition during irradiation on the total-dose response of a bipolar voltage comparator is investigated. Experimental results obtained with input pins biased asymmetrically during irradiation exhibit completely different total-dose response compared to irradiation with all pin...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2006-12, Vol.53 (6), p.3232-3236 |
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| container_title | IEEE transactions on nuclear science |
| container_volume | 53 |
| creator | Bernard, M. F. Dusseau, L. Boch, J. Vaille, J.-R. Saigne, F. Schrimpf, R.D. Lorfevre, E. David, J. P. |
| description | The impact of the bias condition during irradiation on the total-dose response of a bipolar voltage comparator is investigated. Experimental results obtained with input pins biased asymmetrically during irradiation exhibit completely different total-dose response compared to irradiation with all pins grounded. Circuit analysis shows that asymmetrical biasing of the input stage creates a mismatch of the gain degradation in the transistors constituting the differential pair |
| doi_str_mv | 10.1109/TNS.2006.885002 |
| format | Article |
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Circuit analysis shows that asymmetrical biasing of the input stage creates a mismatch of the gain degradation in the transistors constituting the differential pair</description><subject>Analog circuits</subject><subject>Analog integrated circuits</subject><subject>Asymmetry</subject><subject>Bias</subject><subject>Bipolar analog circuits</subject><subject>Bipolar transistors</subject><subject>Circuit analysis</subject><subject>circuitry</subject><subject>Circuits</subject><subject>Comparators</subject><subject>Degradation</subject><subject>Electric potential</subject><subject>Electronics</subject><subject>Engineering Sciences</subject><subject>Gain</subject><subject>integrated circuits (ICs)</subject><subject>Ionizing radiation</subject><subject>Irradiation</subject><subject>linear voltage comparator</subject><subject>Manufacturing</subject><subject>Mirrors</subject><subject>Pins</subject><subject>total dose</subject><subject>Voltage</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkb1v2zAQxYmiBeK6mTN0ETo1g5zjp8TRdT4BowUSJytxUo-NAtlUSTlA_vvQUJAht_Ae8XsE7x5jJxwWnIM92_y-WwgAs6hrDSA-sRnXui65rurPbAbA69Iqa4_Y15SeslQa9IzdLXfYv6QuFcEXvzpMxYX31I5Z74rxkYpNGLEvz0Oi4pbSEHa5yShmeAg9xuIh9CP-o2IVtgNGHEP8xr547BMdv51zdn95sVldl-s_Vzer5bpspdZj2Rj826hGeqGtMsZWjfLGoOASqUaSLYDivgbtq0ZYhYa4IZOVAI51ZeWcnU7vPmLvhthtMb64gJ27Xq7d4S7PDBJE9cwz-3Nihxj-7ymNbtullvoedxT2yXFpNNdGKJPRHx_Qp7CPeU3JWS44FzLXnJ1NUBtDSpH8-wc4uEMeLufhDnm4KY_s-D45OiJ6pxVIKWQlXwEfcoNB</recordid><startdate>20061201</startdate><enddate>20061201</enddate><creator>Bernard, M. 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F. ; Dusseau, L. ; Boch, J. ; Vaille, J.-R. ; Saigne, F. ; Schrimpf, R.D. ; Lorfevre, E. ; David, J. 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| source | IEEE Electronic Library (IEL) |
| subjects | Analog circuits Analog integrated circuits Asymmetry Bias Bipolar analog circuits Bipolar transistors Circuit analysis circuitry Circuits Comparators Degradation Electric potential Electronics Engineering Sciences Gain integrated circuits (ICs) Ionizing radiation Irradiation linear voltage comparator Manufacturing Mirrors Pins total dose Voltage |
| title | Analysis of Bias Effects on the Total-Dose Response of a Bipolar Voltage Comparator |
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