MC-ORACLE: A tool for predicting Soft Error Rate

MC-ORACLE: A tool for predicting Soft Error Rate

Natural radiation is known to be a source of microelectronics failure. For instance, neutrons, protons, heavy ions, and alpha particles have all been implicated in the occurrence of soft errors in memory devices. To predict the reliability of electronics devices we developed a tool called MC-ORACLE....

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Veröffentlicht in:Computer physics communications 2011-02, Vol.182 (2), p.317-321
Hauptverfasser: Wrobel, Frédéric, Saigné, Frédéric
Format: Artikel
Sprache:eng
Schlagworte:
Alpha rays
Charge
Criteria
Data storage
Deposition
Electronics
Engineering Sciences
Failure
Monte Carlo methods
RAM
Sensitive volume
Single Event Upset
Soft Error Rate
Soft errors
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Zusammenfassung:Natural radiation is known to be a source of microelectronics failure. For instance, neutrons, protons, heavy ions, and alpha particles have all been implicated in the occurrence of soft errors in memory devices. To predict the reliability of electronics devices we developed a tool called MC-ORACLE. This Monte Carlo application is based on the common empirical soft error criterion for a critical charge deposited in a parallelepiped sensitive volume. MC-ORACLE is able to deal with complex structures composed of various materials. It provides single and multiple error cross sections as well as the soft error rate.
ISSN:0010-4655
1879-2944
DOI:10.1016/j.cpc.2010.10.005