Comparison of SiC Thyristors with Differently Etched JTEs

This paper presents results attained with SiC GTO thyristors terminated by a single step and a graded etched JTE. The comparison of both types of devices reveals no significant difference in the on-state and switching characteristics but a higher blocking capability of some thyristors with the latte...

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Veröffentlicht in:Materials science forum 2012-05, Vol.717-720, p.1167-1170
Hauptverfasser: Scharnholz, Sigo, De Doncker, Rik W., Pâques, Gontran, Dheilly, Nicolas, Planson, Dominique
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Sprache:eng
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Zusammenfassung:This paper presents results attained with SiC GTO thyristors terminated by a single step and a graded etched JTE. The comparison of both types of devices reveals no significant difference in the on-state and switching characteristics but a higher blocking capability of some thyristors with the latter kind of termination. The best devices showed a forward breakdown voltage of nearly 6 kV, which is a distinct progress as against previous results of thyristors with a graded etched JTE. Furthermore, such GTO thyristors have been characterized dynamically for the first time.
ISSN:0255-5476
1662-9752
1662-9752
1662-9760
DOI:10.4028/www.scientific.net/MSF.717-720.1167