Coherent reflection factor of a random rough surface: applications

Expressions for the s and p mean reflected amplitudes of light incident onto a two-dimensional random dielec-tric surface are derived. From these expressions the influence of roughness on the specular component of the field was studied. The effect of the transverse structure of the surface and the r...

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Veröffentlicht in:Journal of the Optical Society of America. A, Optics, image science, and vision Optics, image science, and vision, 1993-12, Vol.10 (12), p.2637-2647
Hauptverfasser: Baylard, Christophe, Maradudin, Alexei A., Greffet, Jean-Jacques
Format: Artikel
Sprache:eng
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Zusammenfassung:Expressions for the s and p mean reflected amplitudes of light incident onto a two-dimensional random dielec-tric surface are derived. From these expressions the influence of roughness on the specular component of the field was studied. The effect of the transverse structure of the surface and the role of surface plasmon in the decay of the reflectivity are investigated. The shift of the Brewster angle is studied and applications to the determination of surface parameters are discussed. Finally, it is shown that roughness induces nonspecular effects on dielectric surfaces near the Brewster angle.
ISSN:1084-7529
1520-8532
DOI:10.1364/JOSAA.10.002637