Scattering of electrically excited surface plasmon polaritons by gold nanoparticles studied by optical interferometry with a scanning tunneling microscope
We study the scattering of electrically excited surface plasmon polaritons (SPP) from individual nanostructures. The tunneling electrons from a scanning tunneling microscope (STM) are used to excite an out-going, circular SPP wave on a thin (50-nm) gold film on which isolated gold nanoparticles (NPs...
Gespeichert in:
Veröffentlicht in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2015-07, Vol.92 (4), p.45438-45438, Article 045438 |
---|---|
Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | We study the scattering of electrically excited surface plasmon polaritons (SPP) from individual nanostructures. The tunneling electrons from a scanning tunneling microscope (STM) are used to excite an out-going, circular SPP wave on a thin (50-nm) gold film on which isolated gold nanoparticles (NPs) have been deposited. Interaction of the excited SPPs with the NPs leads to both in-plane (SPP-to-SPP) and out-of-plane (SPP-to-photon) scattering. We use SPP leakage radiation microscopy to monitor the interference between the incident and in-plane scattered SPP waves in the image plane. By changing the location of the STM tip, the distance of the point-like SPP source to the scatterers can be varied at will, which constitutes a key advantage over other existing techniques. As well, the out-of-plane scattered radiation interferes with the direct light emission from the STM tip in the back focal plane (Fourier plane). This confirms the mutual coherence of the light and SPP emission resulting from the inelastic tunneling of an electron in the STM junction. We use this effect to demonstrate that SPP-to-photon scattering at NPs is highly directional. |
---|---|
ISSN: | 1098-0121 1550-235X |
DOI: | 10.1103/PhysRevB.92.045438 |