Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes

Highlights•We observe atypical laser diode (LD) signatures in reverse I-V measurement identified as microplasma discharges.•Correlation between reverse I-V signatures and LFN measurements appears as a complementary tool for improvement of screening methodology for LD.•Reverse and forward noise spectra especially exhibit 1/f noise.•Some lasers reveal g-r noise component in bias voltages corresponding to reverse I-V slope changes and around ITH.•Presence of g-r noise leads to believe that point defect can be localized near the active zone.