24 h stability of thick multilayer silicene in air

24 h stability of thick multilayer silicene in air

Thick epitaxial multilayer silicene films with a √3 × √3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comp...

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Veröffentlicht in:2d materials 2014-08, Vol.1 (2), p.21003
Hauptverfasser: De Padova, Paola, Ottaviani, Carlo, Quaresima, Claudio, Olivieri, Bruno, Imperatori, Patrizia, Salomon, Eric, Angot, Thierry, Quagliano, Lucia, Romano, Claudia, Vona, Alessandro, Muniz-Miranda, Maurizio, Generosi, Amanda, Paci, Barbara, Le Lay, Guy
Format: Artikel
Sprache:eng
Schlagworte:
AES
Condensed Matter
EDXR
LEED
Materials Science
Physics
Raman spectroscopy
STM
thick multilayer silicene
XRD
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Beschreibung
Zusammenfassung:Thick epitaxial multilayer silicene films with a √3 × √3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.
ISSN:2053-1583
2053-1583
DOI:10.1088/2053-1583/1/2/021003