MT - BCS-Based Microwave Imaging Approach Through Minimum-Norm Current Expansion

An innovative three-step technique based on the multi-task Bayesian compressive sensing (MT - BCS) strategy is introduced to image 2D-sparse dielectric profiles. The proposed approach reformulates the contrast source mathematical description of the inversion problem into two fictitious real-valued ones jointly solved through a fast Relevance Vector Machine by taking into account the inter-relationships between the real and the imaginary parts of the unknown equivalent currents. Selected results from a numerical validation are presented and discussed to comparatively assess the accuracy, the robustness, and the computational efficiency of the proposed implementation.