Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution

Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution

The purpose of this paper is to present original concepts offering an uncertainty control advancement for measuring machines. Those concepts were developed from the analysis of phenomena that reduce the machine accuracy constructed around principles of standard architecture. A machine being develope...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Revue française de métrologie 2005-04, Vol.2005-4, p.35-43
Hauptverfasser: Lahousse, Ludovic, David, Jean-Marie, Leleu, Stéphane, Vailleau, Georges-Pierre, Ducourtieux, Sébastien
Format: Artikel
Sprache:fre
Schlagworte:
Engineering Sciences
Mechanical engineering
Mechanics
Physics
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 43
container_issue
container_start_page 35
container_title Revue française de métrologie
container_volume 2005-4
creator Lahousse, Ludovic
David, Jean-Marie
Leleu, Stéphane
Vailleau, Georges-Pierre
Ducourtieux, Sébastien
description The purpose of this paper is to present original concepts offering an uncertainty control advancement for measuring machines. Those concepts were developed from the analysis of phenomena that reduce the machine accuracy constructed around principles of standard architecture. A machine being developed is a concrete materialization of those concepts.
format Article
fullrecord <record><control><sourceid>hal</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_00941291v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>oai_HAL_hal_00941291v1</sourcerecordid><originalsourceid>FETCH-hal_primary_oai_HAL_hal_00941291v13</originalsourceid><addsrcrecordid>eNqVTbtOwzAUtRBIVNB_uBtiiBQ7kChjhUAdGNmji3PbWHLs4Ecr_oa135GB38KuCoKR6Ryd5xlb8Kapi0rw-_MjFwVvWnHJlt6r17KqRS14yRfsczVNWkkMyhrob6IhMDbuSGsCaY2k6eSgk4MKJEN0BPMH5OSISUvYJ0o-G4m5-eCtjseaQWPH-RCceosEv6_sBhAM7eHPbk9ebQ0Em8yRME0qs_252asw5FYepbQpwdH31TW72KD2tDzhFbt9enx5WBcD6m5yakT33llU3Xr13GWtLNs7Llq-49V_sl-vbHQ7</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution</title><source>EZB-FREE-00999 freely available EZB journals</source><creator>Lahousse, Ludovic ; David, Jean-Marie ; Leleu, Stéphane ; Vailleau, Georges-Pierre ; Ducourtieux, Sébastien</creator><creatorcontrib>Lahousse, Ludovic ; David, Jean-Marie ; Leleu, Stéphane ; Vailleau, Georges-Pierre ; Ducourtieux, Sébastien</creatorcontrib><description>The purpose of this paper is to present original concepts offering an uncertainty control advancement for measuring machines. Those concepts were developed from the analysis of phenomena that reduce the machine accuracy constructed around principles of standard architecture. A machine being developed is a concrete materialization of those concepts.</description><identifier>ISSN: 1772-1792</identifier><identifier>EISSN: 1776-3215</identifier><language>fre</language><publisher>Laboratoire national de métrologie et d'essais (LNE)</publisher><subject>Engineering Sciences ; Mechanical engineering ; Mechanics ; Physics</subject><ispartof>Revue française de métrologie, 2005-04, Vol.2005-4, p.35-43</ispartof><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885</link.rule.ids><backlink>$$Uhttps://hal.science/hal-00941291$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Lahousse, Ludovic</creatorcontrib><creatorcontrib>David, Jean-Marie</creatorcontrib><creatorcontrib>Leleu, Stéphane</creatorcontrib><creatorcontrib>Vailleau, Georges-Pierre</creatorcontrib><creatorcontrib>Ducourtieux, Sébastien</creatorcontrib><title>Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution</title><title>Revue française de métrologie</title><description>The purpose of this paper is to present original concepts offering an uncertainty control advancement for measuring machines. Those concepts were developed from the analysis of phenomena that reduce the machine accuracy constructed around principles of standard architecture. A machine being developed is a concrete materialization of those concepts.</description><subject>Engineering Sciences</subject><subject>Mechanical engineering</subject><subject>Mechanics</subject><subject>Physics</subject><issn>1772-1792</issn><issn>1776-3215</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqVTbtOwzAUtRBIVNB_uBtiiBQ7kChjhUAdGNmji3PbWHLs4Ecr_oa135GB38KuCoKR6Ryd5xlb8Kapi0rw-_MjFwVvWnHJlt6r17KqRS14yRfsczVNWkkMyhrob6IhMDbuSGsCaY2k6eSgk4MKJEN0BPMH5OSISUvYJ0o-G4m5-eCtjseaQWPH-RCceosEv6_sBhAM7eHPbk9ebQ0Em8yRME0qs_252asw5FYepbQpwdH31TW72KD2tDzhFbt9enx5WBcD6m5yakT33llU3Xr13GWtLNs7Llq-49V_sl-vbHQ7</recordid><startdate>200504</startdate><enddate>200504</enddate><creator>Lahousse, Ludovic</creator><creator>David, Jean-Marie</creator><creator>Leleu, Stéphane</creator><creator>Vailleau, Georges-Pierre</creator><creator>Ducourtieux, Sébastien</creator><general>Laboratoire national de métrologie et d'essais (LNE)</general><scope>1XC</scope><scope>VOOES</scope></search><sort><creationdate>200504</creationdate><title>Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution</title><author>Lahousse, Ludovic ; David, Jean-Marie ; Leleu, Stéphane ; Vailleau, Georges-Pierre ; Ducourtieux, Sébastien</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-hal_primary_oai_HAL_hal_00941291v13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>fre</language><creationdate>2005</creationdate><topic>Engineering Sciences</topic><topic>Mechanical engineering</topic><topic>Mechanics</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lahousse, Ludovic</creatorcontrib><creatorcontrib>David, Jean-Marie</creatorcontrib><creatorcontrib>Leleu, Stéphane</creatorcontrib><creatorcontrib>Vailleau, Georges-Pierre</creatorcontrib><creatorcontrib>Ducourtieux, Sébastien</creatorcontrib><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Revue française de métrologie</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lahousse, Ludovic</au><au>David, Jean-Marie</au><au>Leleu, Stéphane</au><au>Vailleau, Georges-Pierre</au><au>Ducourtieux, Sébastien</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution</atitle><jtitle>Revue française de métrologie</jtitle><date>2005-04</date><risdate>2005</risdate><volume>2005-4</volume><spage>35</spage><epage>43</epage><pages>35-43</pages><issn>1772-1792</issn><eissn>1776-3215</eissn><abstract>The purpose of this paper is to present original concepts offering an uncertainty control advancement for measuring machines. Those concepts were developed from the analysis of phenomena that reduce the machine accuracy constructed around principles of standard architecture. A machine being developed is a concrete materialization of those concepts.</abstract><pub>Laboratoire national de métrologie et d'essais (LNE)</pub><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1772-1792
ispartof Revue française de métrologie, 2005-04, Vol.2005-4, p.35-43
issn 1772-1792
1776-3215
language fre
recordid cdi_hal_primary_oai_HAL_hal_00941291v1
source EZB-FREE-00999 freely available EZB journals
subjects Engineering Sciences
Mechanical engineering
Mechanics
Physics
title Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T01%3A13%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-hal&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Application%20d'une%20nouvelle%20conception%20d'architecture%20%C3%A0%20une%20machine%20de%20mesure%20de%20r%C3%A9solution%20nanom%C3%A9trique%20Application%20of%20a%20new%20architecture%20design%20to%20a%20measuring%20machine%20with%20a%20nanometric%20resolution&rft.jtitle=Revue%20fran%C3%A7aise%20de%20m%C3%A9trologie&rft.au=Lahousse,%20Ludovic&rft.date=2005-04&rft.volume=2005-4&rft.spage=35&rft.epage=43&rft.pages=35-43&rft.issn=1772-1792&rft.eissn=1776-3215&rft_id=info:doi/&rft_dat=%3Chal%3Eoai_HAL_hal_00941291v1%3C/hal%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true