Application d'une nouvelle conception d'architecture à une machine de mesure de résolution nanométrique Application of a new architecture design to a measuring machine with a nanometric resolution

The purpose of this paper is to present original concepts offering an uncertainty control advancement for measuring machines. Those concepts were developed from the analysis of phenomena that reduce the machine accuracy constructed around principles of standard architecture. A machine being develope...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Revue française de métrologie 2005-04, Vol.2005-4, p.35-43
Hauptverfasser: Lahousse, Ludovic, David, Jean-Marie, Leleu, Stéphane, Vailleau, Georges-Pierre, Ducourtieux, Sébastien
Format: Artikel
Sprache:fre
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The purpose of this paper is to present original concepts offering an uncertainty control advancement for measuring machines. Those concepts were developed from the analysis of phenomena that reduce the machine accuracy constructed around principles of standard architecture. A machine being developed is a concrete materialization of those concepts.
ISSN:1772-1792
1776-3215