Mass spectrometry techniques in the context of nanometrology

[Display omitted] ► CdS QDs smaller than 6nm diameter were produced by soft chemistry methods. ► MALDI-TOF mass spectrometry technique is applied to QDs for size determination. ► MALDI-TOF MS and TEM techniques are complementary tools for nanometrology. With the development of material sciences, the...

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Veröffentlicht in:Microelectronic engineering 2013-08, Vol.108, p.187-191
Hauptverfasser: Fregnaux, M., Gaumet, J.J., Dalmasso, S., Laurenti, J.P., Schneider, R.
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Sprache:eng
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Zusammenfassung:[Display omitted] ► CdS QDs smaller than 6nm diameter were produced by soft chemistry methods. ► MALDI-TOF mass spectrometry technique is applied to QDs for size determination. ► MALDI-TOF MS and TEM techniques are complementary tools for nanometrology. With the development of material sciences, the characterization of nanomaterials has become a critical issue in managing their fascinating size-dependent physical and chemical properties. Controlling these properties from synthesis to the application phase, and consequently to their fate as a worldwide environmental and societal concern, is becoming more and more necessary. In this context, nanometrology, seen as a step to the total control of quantum dot (QD) properties, should make real headway in the near future. From this perspective, we present a careful investigation of small (
ISSN:0167-9317
1873-5568
DOI:10.1016/j.mee.2013.01.043