Determination of in-depth damaged profile by Raman line scan in a pre-cut He2+ irradiated UO2
Raman measurements were carried out to probe the spectroscopic signatures of the ion beam irradiation-induced damage and their in-depth profiles on a Uranium dioxide sample previously cut and polished prior to performing a 25 MeV He2+ cyclotron beam irradiation. Raman spectra clearly show the creati...
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Veröffentlicht in: | Applied physics letters 2012-06, Vol.100 (25) |
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Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Raman measurements were carried out to probe the spectroscopic signatures of the ion beam irradiation-induced damage and their in-depth profiles on a Uranium dioxide sample previously cut and polished prior to performing a 25 MeV He2+ cyclotron beam irradiation. Raman spectra clearly show the creation of three defects bands (U1 ≈ 530, U2 ≈ 575, and U3 ≈ 635 cm−1) resulting from the ion irradiation and also some changes in the T2g peak of UO2. Their in-depth distribution inside the sample exhibits a clear increase of the damage from the surface up to the position of the implanted He. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.4729588 |