Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm

Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm

The single-event upset (SEU) fault tolerance of a benchmark self-converging algorithm is evaluated by fault injection campaigns performed using a devoted test platform. The number of observed errors significantly decreases depending on adopted implementation strategies.

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Veröffentlicht in:IEEE transactions on nuclear science 2012-08, Vol.59 (4), p.818-823
Hauptverfasser: Velazco, Raoul, Mansour, Wassim, Pancher, Fabrice, Marques-Costa, Greicy, Sohier, Devan, Bui, Alain
Format: Artikel
Sprache:eng
Schlagworte:
Algorithms
Benchmarking
Circuit faults
Engineering Sciences
Errors
Fault injection
Fault tolerance
Fault tolerant systems
Faults
Field programmable gate arrays
Micro and nanotechnologies
Microelectronics
Platforms
Radiation detectors
Registers
self-stabilization
single-event upset (SEU)
Software
Strategy
triple modular redundancy (TMR)
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Beschreibung
Zusammenfassung:The single-event upset (SEU) fault tolerance of a benchmark self-converging algorithm is evaluated by fault injection campaigns performed using a devoted test platform. The number of observed errors significantly decreases depending on adopted implementation strategies.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2012.2188303