Side-Gated Transport in Focused-Ion-Beam-Fabricated Multilayered Graphene Nanoribbons
A resist‐less nanofabrication method, based on focused ion beam lithography, for connecting and tailoring a nanometer‐scale planar device in ultrathin graphitic disks is demonstrated by producing 50‐nm‐wide double side‐gated transistor devices (see image). Experiments and theory suggest that the beh...
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Veröffentlicht in: | Small (Weinheim an der Bergstrasse, Germany) Germany), 2008-06, Vol.4 (6), p.716-720 |
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creator | Dayen, Jean-François Mahmood, Ather Golubev, Dmitry S. Roch-Jeune, Isabelle Salles, Philippe Dujardin, Erik |
description | A resist‐less nanofabrication method, based on focused ion beam lithography, for connecting and tailoring a nanometer‐scale planar device in ultrathin graphitic disks is demonstrated by producing 50‐nm‐wide double side‐gated transistor devices (see image). Experiments and theory suggest that the behavior of the nanoribbons can be interpreted as a Coulomb blockade in a linear array of tunnel junctions between graphene islands. |
doi_str_mv | 10.1002/smll.200700913 |
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subjects | Engineering Sciences field-effect transistors graphene Graphite - chemistry Ions lithography Micro and nanotechnologies Microelectronics Microscopy, Atomic Force Microscopy, Electron, Scanning Nanostructures organic electronics Temperature |
title | Side-Gated Transport in Focused-Ion-Beam-Fabricated Multilayered Graphene Nanoribbons |
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