193 nm deep-ultraviolet solar-blind cubic boron nitride based photodetectors

Deep-ultraviolet (DUV) solar-blind photodetectors based on high-quality cubic boron nitride ( c BN ) films with a metal/semiconductor/metal configuration were fabricated. The design of interdigitated circular electrodes enables high homogeneity of electric field between pads. The DUV photodetectors...

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Veröffentlicht in:Applied physics letters 2008-02, Vol.92 (5), p.053501-053501-3
Hauptverfasser: Soltani, A., Barkad, H. A., Mattalah, M., Benbakhti, B., De Jaeger, J.-C., Chong, Y. M., Zou, Y. S., Zhang, W. J., Lee, S. T., BenMoussa, A., Giordanengo, B., Hochedez, J.-F.
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Sprache:eng
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Zusammenfassung:Deep-ultraviolet (DUV) solar-blind photodetectors based on high-quality cubic boron nitride ( c BN ) films with a metal/semiconductor/metal configuration were fabricated. The design of interdigitated circular electrodes enables high homogeneity of electric field between pads. The DUV photodetectors present a peak responsivity at 180 nm with a very sharp cutoff wavelength at 193 nm and a visible rejection ratio (180 versus 250 nm ) of more than four orders of magnitude. The characteristics of the photodetectors present extremely low dark current, high breakdown voltage, and high responsivity, suggesting that c BN films are very promising for DUV sensing.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2840178