193 nm deep-ultraviolet solar-blind cubic boron nitride based photodetectors
Deep-ultraviolet (DUV) solar-blind photodetectors based on high-quality cubic boron nitride ( c BN ) films with a metal/semiconductor/metal configuration were fabricated. The design of interdigitated circular electrodes enables high homogeneity of electric field between pads. The DUV photodetectors...
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Veröffentlicht in: | Applied physics letters 2008-02, Vol.92 (5), p.053501-053501-3 |
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Hauptverfasser: | , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
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Zusammenfassung: | Deep-ultraviolet (DUV) solar-blind photodetectors based on high-quality cubic boron nitride
(
c
BN
)
films with a metal/semiconductor/metal configuration were fabricated. The design of interdigitated circular electrodes enables high homogeneity of electric field between pads. The DUV photodetectors present a peak responsivity at
180
nm
with a very sharp cutoff wavelength at
193
nm
and a visible rejection ratio (180 versus
250
nm
) of more than four orders of magnitude. The characteristics of the photodetectors present extremely low dark current, high breakdown voltage, and high responsivity, suggesting that
c
BN
films are very promising for DUV sensing. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2840178 |