Characterization of PPLN-microstructures by means of Raman spectroscopy
In this paper we show how the Raman microprobe can be used for characterization of the domain structure in periodically poled lithium niobate (PPLN). The Raman scattered intensity of the transverse and longitudinal optical phonons was recorded across the stripe ferroelectric domains at the surface o...
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| Veröffentlicht in: | Applied physics. A, Materials science & processing Materials science & processing, 2008-04, Vol.91 (1), p.65-67 |
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| container_title | Applied physics. A, Materials science & processing |
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| creator | Hammoum, R. Fontana, M.D. Bourson, P. Shur, V.Y. |
| description | In this paper we show how the Raman microprobe can be used for characterization of the domain structure in periodically poled lithium niobate (PPLN). The Raman scattered intensity of the transverse and longitudinal optical phonons was recorded across the stripe ferroelectric domains at the surface of a z-cut congruent PPLN sample. The change of integrated intensities across the domain structure was attributed to the influence of mechanical stresses and partially screened depolarization fields. |
| doi_str_mv | 10.1007/s00339-007-4356-3 |
| format | Article |
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| issn | 0947-8396 1432-0630 |
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| subjects | Characterization and Evaluation of Materials Condensed Matter Physics Machines Manufacturing Nanotechnology Optical and Electronic Materials Optics Physics Physics and Astronomy Processes Surfaces and Interfaces Thin Films |
| title | Characterization of PPLN-microstructures by means of Raman spectroscopy |
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