Characterization of PPLN-microstructures by means of Raman spectroscopy

In this paper we show how the Raman microprobe can be used for characterization of the domain structure in periodically poled lithium niobate (PPLN). The Raman scattered intensity of the transverse and longitudinal optical phonons was recorded across the stripe ferroelectric domains at the surface o...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2008-04, Vol.91 (1), p.65-67
Hauptverfasser: Hammoum, R., Fontana, M.D., Bourson, P., Shur, V.Y.
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Sprache:eng
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Zusammenfassung:In this paper we show how the Raman microprobe can be used for characterization of the domain structure in periodically poled lithium niobate (PPLN). The Raman scattered intensity of the transverse and longitudinal optical phonons was recorded across the stripe ferroelectric domains at the surface of a z-cut congruent PPLN sample. The change of integrated intensities across the domain structure was attributed to the influence of mechanical stresses and partially screened depolarization fields.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-007-4356-3