Determination of transport coefficients by transient photoconductivity measurements

Determination of transport coefficients by transient photoconductivity measurements

The purpose of this paper is to describe a new experimental method which allows to obtaine the drift velocity, the diffusion coefficient and the life time of minority carriers in semiconductors of usual resistivity. These coefficients are measured using transient photoconductivity response.

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physica B + C 1985-01, Vol.129 (1), p.524-526
Hauptverfasser: Gasquet, D., Nougier, J.P., Gineste, G.
Format: Artikel
Sprache:eng
Schlagworte:
Electronics
Engineering Sciences
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The purpose of this paper is to describe a new experimental method which allows to obtaine the drift velocity, the diffusion coefficient and the life time of minority carriers in semiconductors of usual resistivity. These coefficients are measured using transient photoconductivity response.
ISSN:0378-4363
DOI:10.1016/0378-4363(85)90637-0