Surface investigations of bonded perfluoro polyether monolayers on gold surfaces

Thin films of functionalized perfluorinated polyether have been deposited on gold surfaces. XPS of freshly deposited layers rinsed in the proper solvent has shown that a thiolate bond is formed. Spectra performed on layers aged 15 days before the rinsing process display drastically different features. Fewer molecules are rinsed off and the main component of the sulfur peak corresponds to free sulfur. Conducting‐probe AFM is then used to characterize the mechanical and electrical properties of these layers. Confirmation of the higher thickness of the aged rinsed films is obtained from the delay between the mechanical and the electrical contacts. Copyright © 2004 John Wiley & Sons, Ltd.