Piezoforce microscopy study of lead-free perovskite Na0.5Bi0.5TiO3 thin films

Piezoforce microscopy study of lead-free perovskite Na0.5Bi0.5TiO3 thin films

As a promising lead-free ferroelectric material, Na0.5Bi0.5TiO3 (NBT) was synthesized as thin films via a classic 2-methoxyethanol sol-gel route and chemical solution deposition method. Perovskite structure with random orientation of crystallites has been obtained on platinized silicon wafer at low...

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Veröffentlicht in:Applied physics letters 2007-04, Vol.90 (15), p.152905-1-152905-3
Hauptverfasser: Rémondière, F., Wu, A., Vilarinho, P. M., Mercurio, J. P.
Format: Artikel
Sprache:eng
Schlagworte:
Chemical Sciences
Material chemistry
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Zusammenfassung:As a promising lead-free ferroelectric material, Na0.5Bi0.5TiO3 (NBT) was synthesized as thin films via a classic 2-methoxyethanol sol-gel route and chemical solution deposition method. Perovskite structure with random orientation of crystallites has been obtained on platinized silicon wafer at low temperature (460°C). Piezoelectric activity in such films was detected using electrical analysis. X-ray diffraction and piezoresponse force microscopy (PFM) have been used to analyze NBT thin films with different microstructures and properties dependent on fabrication and annealing processes.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2721843