Experimental evaluation of gate architecture influence on multi-gate Silicon On Insulator MOSFETs performance

Experimental evaluation of gate architecture influence on multi-gate Silicon On Insulator MOSFETs performance

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Veröffentlicht in:IEEE transactions on electron devices 2005, Vol.52, p.1772-11779
1. Verfasser: Widiez J. Lolivier M. Vinet T. Poiroux B. Previtali F. Daugé M. Mouis S. Deleonibus, J.
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Engineering Sciences
Micro and nanotechnologies
Microelectronics
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creator Widiez J. Lolivier M. Vinet T. Poiroux B. Previtali F. Daugé M. Mouis S. Deleonibus, J.
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subjects Engineering Sciences
Micro and nanotechnologies
Microelectronics
title Experimental evaluation of gate architecture influence on multi-gate Silicon On Insulator MOSFETs performance
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