One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques

One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques

This paper describes a procedure for the characterization of defects inside dielectric materials. This nondestructive technique is supported by the development of a system that operates at 35 GHz. The reconstruction of the defect profile is performed by considering that the measured data are the res...

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Veröffentlicht in:Microwave and optical technology letters 2004-10, Vol.43 (2), p.133-138
Hauptverfasser: Maazi, M., Glay, D., Lasri, T.
Format: Artikel
Sprache:eng
Schlagworte:
blind deconvolution
defects
millimeter waves
nondestructive testing
subsurface
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Zusammenfassung:This paper describes a procedure for the characterization of defects inside dielectric materials. This nondestructive technique is supported by the development of a system that operates at 35 GHz. The reconstruction of the defect profile is performed by considering that the measured data are the result of a convolution of the true data with a point‐spread function (PSF). © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 133–138, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20399
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.20399