A different way of performing picosecond ultrasonic measurements in thin transparent films based on laser-wavelength effects
We present a way of using picosecond ultrasonics to simultaneously get the thickness and elastic properties of thin dielectric layers. This is based on the use of a blue probe which is shown to improve the detection of acousto-optic oscillations in the dielectric from which the sound velocity can be...
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Veröffentlicht in: | Applied physics letters 2005-05, Vol.86 (21), p.211903-211903-3 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | We present a way of using picosecond ultrasonics to simultaneously get the thickness and elastic properties of thin dielectric layers. This is based on the use of a blue probe which is shown to improve the detection of acousto-optic oscillations in the dielectric from which the sound velocity can be measured from the refractive index. At the same wavelength a strong response of the silicon is used to detect the arrival of the acoustic pulse. We apply this scheme to various materials deposited on silicon substrates. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.1929869 |