Caracterizacion por XPS de lateritas estandar

Caracterizacion por XPS de lateritas estandar

Photoelectron spectroscopy (XPS) is used to characterize mainly two standard laterite samples. Samples of Fe2O3, SiO2, and Al2O3 were also analysed for comparison purposes. A detailed study of the O1s band of oxygen present in these samples allowed us to obtain information which was used to distingu...

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Veröffentlicht in:Revista mexicana de física 2003, Vol.49
Hauptverfasser: Mendialdua, J., Casanova, R., Rueda, F., Rodriguez, A., Mantilla, M., Quinones, J., Alarcon, L., Escalante, E., Hoffmann, P., Taiebi, I., Jalowiecki-Duhamel, Louise
Format: Artikel
Sprache:eng
Schlagworte:
Catalysis
Chemical Sciences
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Zusammenfassung:Photoelectron spectroscopy (XPS) is used to characterize mainly two standard laterite samples. Samples of Fe2O3, SiO2, and Al2O3 were also analysed for comparison purposes. A detailed study of the O1s band of oxygen present in these samples allowed us to obtain information which was used to distinguish clearly the samples.
ISSN:0035-001X