Observation of the interferences between the emitted beams in a 4Pi microscope by partial coherence interferometry

We propose a modified 4Pi microscope setup for observing solely the interference resulting from the superposition of the beams emitted by fluorescent species placed between two microscope objectives. A scanning Michelson interferometer is coupled to the 4Pi microscope. Interferences between the beams emitted by fluorophores deposited on a cover glass are observed, thanks to partial coherence interferometry technique.