Teager-Kaiser energy and higher order operators in white light interference microscopy for surface shape measurement

Teager-Kaiser energy and higher order operators in white light interference microscopy for surface shape measurement

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Veröffentlicht in:EURASIP journal on applied signal processing 2005, Vol.17, p.2804-2815
Hauptverfasser: Salzenstein, Fabien, Montgomery, Paul, Montaner, Denis, Boudraa, A.
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Sprache:eng
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container_title EURASIP journal on applied signal processing
container_volume 17
creator Salzenstein, Fabien
Montgomery, Paul
Montaner, Denis
Boudraa, A.
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title Teager-Kaiser energy and higher order operators in white light interference microscopy for surface shape measurement
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