Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5 ≤ E ≤ 28 keV

This work presents the new Metrology beamline at the SOLEIL synchrotron facility and a first attempt to quantitative measurements of mass attenuation coefficients for Ag and Sn performed on the hard X‐ray branch. We first describe the beamline itself and the characterization performed of the unfocused monochromatic beam running mode. We performed a first experimental measurement of mass attenuation coefficients in the range 3.5 ≤ E ≤ 28 keV and we also derived the K‐absorption and L‐absorption jump ratios. The results are compared with theoretical values as well as with other experimental data and agree well with previous published values. Copyright © 2011 John Wiley & Sons, Ltd.