Effect of the formation conditions on the properties of ZnO:Ga thin films deposited by magnetron-assisted sputtering onto a cold substrate

The results of studying ZnO:Ga thin films produced by magnetron-assisted sputtering of the corresponding target in argon and in argon with a 5% hydrogen content without heating of the substrate are reported. It is shown that the resistivity and temporal stability of the ZnO:Ga films substantially de...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2013-12, Vol.47 (13), p.1687-1691
Hauptverfasser: Gromov, D. G., Koz’min, A. M., Shulyat’ev, A. S., Polomoshnov, S. A., Bogolyubova, D. N., Shamanaev, S. V.
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Sprache:eng
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Zusammenfassung:The results of studying ZnO:Ga thin films produced by magnetron-assisted sputtering of the corresponding target in argon and in argon with a 5% hydrogen content without heating of the substrate are reported. It is shown that the resistivity and temporal stability of the ZnO:Ga films substantially depend on their thickness, exposure to solar radiation, and influence of the environment. It is found that doping the ZnO:Ga thin films with hydrogen provides a means for greatly decreasing their resistivity, whereas the degree of temporal stability of the films can be improved using a coating protecting them from the influence of the gas environment.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782613130083