Polarization Processes in Thin Layers of Amorphous MoS.sub.2 Obtained by RF Magnetron Sputtering

The polarization processes in thin layers of amorphous molybdenum disulfide MoS.sub.2 are studied by dielectric spectroscopy techniques. The process of dipole-relaxation polarization is observed. The microscopic parameters of the system are calculated, and the relaxation time of the dipole-polarizat...

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Veröffentlicht in:	Semiconductors (Woodbury, N.Y.) N.Y.), 2020-05, Vol.54 (5), p.558
Hauptverfasser:	Kononov, A. A, Castro-Arata, R. A, Glavnaya, D. D, Stozharov, V. M, Dolginsev, D. M, Saito, Y, Fons, P
Format:	Artikel
Sprache:	eng
Schlagworte:	Activation energy Electric properties
Online-Zugang:	Volltext
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