Phase formation upon the interaction of thin films in the system [Yb.sub.1-x][Sm.sub.x]Te-[As.sub.2][Te.sub.3]

Phase formation upon the interaction of thin films in the system [Yb.sub.1-x][Sm.sub.x]Te-[As.sub.2][Te.sub.3]

Phase formation upon the interaction of thin [Yb.sub.1-x][Sm.sub.x]Te(x = 0.02) and [As.sub.2][Te.sub.3] films obtained through their simultaneous and successive evaporation is studied. It is shown that the [Yb.sub.1-x][Sm.sub.x][As.sub.4][Te.sub.7] phase is formed upon interaction of the thin films...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2014-11, Vol.48 (11), p.1525
1. Verfasser: Hajiyev, E. Sh
Format: Artikel
Sprache:eng
Schlagworte:
Dielectric films
Thin films
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Zusammenfassung:Phase formation upon the interaction of thin [Yb.sub.1-x][Sm.sub.x]Te(x = 0.02) and [As.sub.2][Te.sub.3] films obtained through their simultaneous and successive evaporation is studied. It is shown that the [Yb.sub.1-x][Sm.sub.x][As.sub.4][Te.sub.7] phase is formed upon interaction of the thin films at a temperature of 473 K and the [Yb.sub.1-x][Sm.sub.x][As.sub.2][Te.sub.4] phase at 503 K. DOI: 10.1134/S1063782614110116
ISSN:1063-7826
DOI:10.1134/S1063782614110116