X-ray sensitivity of [Cd.sub.0.9][Zn.sub.0.1]Te detectors

The X-ray sensitivity of [Cd.sub.0.9][Zn.sub.0.1]Te detectors as a function of the effective X-ray energy and bias voltage is studied. It is shown that the sensitivity grows with effective X-ray energy and much more significantly with bias voltage. The sensitivity depends on the angle the X-ray beam...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Technical physics 2010-02, Vol.55 (2), p.306
Hauptverfasser: Dvoryankin, V.F, Dvoryankina, G.G, Kudryashov, A.A, Petrov, A.G, Golyshev, V.D, Bykova, S.V
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The X-ray sensitivity of [Cd.sub.0.9][Zn.sub.0.1]Te detectors as a function of the effective X-ray energy and bias voltage is studied. It is shown that the sensitivity grows with effective X-ray energy and much more significantly with bias voltage. The sensitivity depends on the angle the X-ray beam makes with an electric field in the detector. In the energy range 28-72 keV, the sensitivity is the highest when the X-ray beam is normal to the electric field in the detector. DOI: 10.1134/S1063784210020246
ISSN:1063-7842
DOI:10.1134/S1063784210020246