X-ray sensitivity of [Cd.sub.0.9][Zn.sub.0.1]Te detectors
The X-ray sensitivity of [Cd.sub.0.9][Zn.sub.0.1]Te detectors as a function of the effective X-ray energy and bias voltage is studied. It is shown that the sensitivity grows with effective X-ray energy and much more significantly with bias voltage. The sensitivity depends on the angle the X-ray beam...
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Veröffentlicht in: | Technical physics 2010-02, Vol.55 (2), p.306 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The X-ray sensitivity of [Cd.sub.0.9][Zn.sub.0.1]Te detectors as a function of the effective X-ray energy and bias voltage is studied. It is shown that the sensitivity grows with effective X-ray energy and much more significantly with bias voltage. The sensitivity depends on the angle the X-ray beam makes with an electric field in the detector. In the energy range 28-72 keV, the sensitivity is the highest when the X-ray beam is normal to the electric field in the detector. DOI: 10.1134/S1063784210020246 |
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ISSN: | 1063-7842 |
DOI: | 10.1134/S1063784210020246 |