Far-infrared radiation from n-InGaAs/GaAs quantum-well heterostructures in high lateral electric fields under injection conditions
The infrared radiation emitted by hot electrons in n -InGaAs/GaAs quantum-well heterostructures subjected to a lateral electric field is investigated under conditions of carrier injection from the current contacts. In structures with double tunneling-coupled wells one of which is δ-doped, a pronounc...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2014-05, Vol.48 (5), p.625-629 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The infrared radiation emitted by hot electrons in
n
-InGaAs/GaAs quantum-well heterostructures subjected to a lateral electric field is investigated under conditions of carrier injection from the current contacts. In structures with double tunneling-coupled wells one of which is δ-doped, a pronounced increase in the intensity of far-infrared radiation upon the onset of carrier injection is observed. At the same time, this effect is lacking in single-quantum-well structures with doped wells or barriers. The observed increase in the radiation intensity is associated with the direct intersubband transitions of electrons which contribute to emission upon the real-space transfer of charge carriers between wells. The intensity of these transitions increases due to compensation of the space charge existing between the wells by the injected holes. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782614050029 |