IR spectral characteristics of lithium hydride thin films

Lithium hydride thin films were deposited by pulsed laser deposition and structurally characterized by means of IR spectra. The pressure of H 2 used as a reactive gas was changed and the substrate temperature, substrate- target distance, laser fluence, and other conditions were defined. The research...

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Veröffentlicht in:Journal of applied spectroscopy 2010-03, Vol.77 (1), p.140-143
Hauptverfasser: Lei, J.-H., Xing, P.-F., Tang, Y.-J., Wu, W.-D., Wang, F.
Format: Artikel
Sprache:eng
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Zusammenfassung:Lithium hydride thin films were deposited by pulsed laser deposition and structurally characterized by means of IR spectra. The pressure of H 2 used as a reactive gas was changed and the substrate temperature, substrate- target distance, laser fluence, and other conditions were defined. The research result shows that the pressure of H 2 is an important factor that affects the quality of lithium hydride films. With increase in hydrogen gas pressure, the H 2 content in the films rises and peak maxima of the Li–H bond move to higher wave numbers.
ISSN:0021-9037
1573-8647
DOI:10.1007/s10812-010-9305-9