IR spectral characteristics of lithium hydride thin films
Lithium hydride thin films were deposited by pulsed laser deposition and structurally characterized by means of IR spectra. The pressure of H 2 used as a reactive gas was changed and the substrate temperature, substrate- target distance, laser fluence, and other conditions were defined. The research...
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Veröffentlicht in: | Journal of applied spectroscopy 2010-03, Vol.77 (1), p.140-143 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Lithium hydride thin films were deposited by pulsed laser deposition and structurally characterized by means of IR spectra. The pressure of H
2
used as a reactive gas was changed and the substrate temperature, substrate- target distance, laser fluence, and other conditions were defined. The research result shows that the pressure of H
2
is an important factor that affects the quality of lithium hydride films. With increase in hydrogen gas pressure, the H
2
content in the films rises and peak maxima of the Li–H bond move to higher wave numbers. |
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ISSN: | 0021-9037 1573-8647 |
DOI: | 10.1007/s10812-010-9305-9 |