Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers

The results of investigations of the morphology (grain size, twinning, growth features), elemental composition, and some mechanical properties of polycrystalline CdTe layers deposited on nonoriented substrates in a quasi-closed volume are presented. Dependences of microhardness on the crystallite si...

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Veröffentlicht in:	Semiconductors (Woodbury, N.Y.) N.Y.), 2011-12, Vol.45 (12), p.1531-1537
Hauptverfasser:	Kurilo, I. V., Ilchuk, H. A., Lukashuk, S. V., Rudyi, I. O., Ukrainets, V. O., Chekaylo, N. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analysis Diffusion Epitaxy Hardness Magnetic Materials Magnetism Mechanical properties Nonelectronic Properties of Semiconductors (Atomic Structure Physics Physics and Astronomy Semiconductors
Online-Zugang:	Volltext
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