Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers

The results of investigations of the morphology (grain size, twinning, growth features), elemental composition, and some mechanical properties of polycrystalline CdTe layers deposited on nonoriented substrates in a quasi-closed volume are presented. Dependences of microhardness on the crystallite si...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2011-12, Vol.45 (12), p.1531-1537
Hauptverfasser: Kurilo, I. V., Ilchuk, H. A., Lukashuk, S. V., Rudyi, I. O., Ukrainets, V. O., Chekaylo, N. V.
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Sprache:eng
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Zusammenfassung:The results of investigations of the morphology (grain size, twinning, growth features), elemental composition, and some mechanical properties of polycrystalline CdTe layers deposited on nonoriented substrates in a quasi-closed volume are presented. Dependences of microhardness on the crystallite size and layer thickness are presented. The evaluation calculations of the stresses on the substrate-layer interface caused by a difference in the linear thermal expansion coefficients are presented.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782611120086