Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers

Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers

The results of investigations of the morphology (grain size, twinning, growth features), elemental composition, and some mechanical properties of polycrystalline CdTe layers deposited on nonoriented substrates in a quasi-closed volume are presented. Dependences of microhardness on the crystallite si...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2011-12, Vol.45 (12), p.1531-1537
Hauptverfasser: Kurilo, I. V., Ilchuk, H. A., Lukashuk, S. V., Rudyi, I. O., Ukrainets, V. O., Chekaylo, N. V.
Format: Artikel
Sprache:eng
Schlagworte:
Analysis
Diffusion
Epitaxy
Hardness
Magnetic Materials
Magnetism
Mechanical properties
Nonelectronic Properties of Semiconductors (Atomic Structure
Physics
Physics and Astronomy
Semiconductors
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container_issue 12
container_start_page 1531
container_title Semiconductors (Woodbury, N.Y.)
container_volume 45
creator Kurilo, I. V.
Ilchuk, H. A.
Lukashuk, S. V.
Rudyi, I. O.
Ukrainets, V. O.
Chekaylo, N. V.
description The results of investigations of the morphology (grain size, twinning, growth features), elemental composition, and some mechanical properties of polycrystalline CdTe layers deposited on nonoriented substrates in a quasi-closed volume are presented. Dependences of microhardness on the crystallite size and layer thickness are presented. The evaluation calculations of the stresses on the substrate-layer interface caused by a difference in the linear thermal expansion coefficients are presented.
doi_str_mv 10.1134/S1063782611120086
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subjects Analysis
Diffusion
Epitaxy
Hardness
Magnetic Materials
Magnetism
Mechanical properties
Nonelectronic Properties of Semiconductors (Atomic Structure
Physics
Physics and Astronomy
Semiconductors
title Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers
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