Application of short light pulses for measuring parameters of solar cells
An optimum scheme is suggested for controlling bias voltages applied to a solar element in the process of measuring its pulsed current-voltage characteristic (IVC). It is shown that the use of an optimum law of control of the bias voltage under conditions of a sufficiently short light pulse (6.5 ms)...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2010-12, Vol.44 (13), p.1727-1730 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | An optimum scheme is suggested for controlling bias voltages applied to a solar element in the process of measuring its pulsed current-voltage characteristic (IVC). It is shown that the use of an optimum law of control of the bias voltage under conditions of a sufficiently short light pulse (6.5 ms) makes it possible to substantially reduce the deviation of the dynamic IVC from the ideal static characteristic. This substantially increases the accuracy of the measuring system, which, in turn, leads to an improved accuracy of determining internal parameters of a solar cell proceeding from the consideration of this or that electrical model. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782610130221 |