An investigation of possibilities of improving random test generation for non-scan sequential circuits/Nuosekliu schemu atsitiktinio testu generavimo pagerinimo galimybiu tyrimas

High-performance circuits with aggressive timing constraints are usually very susceptible to delay faults. The latest research shows that functional tests designed using random test generation exhibit good transition fault coverages. In the paper, we investigated the possibilities of improving random test generation for at-speed testing of non-scan synchronous sequential circuits. Based on research of distribution of "1" in randomly generated test pattern we suggested guidance for management of test generation process. The implementation of semi deterministic algorithms showed that the optimisation of separate steps by construction of test subsequences doesn't improve the final outcome. Ill. 2, bibl. 8, tabl. 3 (in English; abstracts in English and Lithuanian). Siuolaikines schemos yra labai jautrios velinimo gedimams. Naujausi tyrimai rodo, kad funkciniai testai, sukonstruoti remiantis atsitiktiniu testiniu rinkiniu generavimu, gerai aptinka perejimo gedimus. Siame straipsnyje nagrinejamos atsitiktinio testu generavimo pagerinimo galimybes. Remiantis tyrimais, atliktais su skirtingu vienetuku ir nuliuku pasiskirstymu atsitiktinai sugeneruotame rinkinyje, pasiulyta testu generavimo proceso valdymo metodika. Idiegus nevisiskai deterministinius algoritmus, pasirode, kad, esant tai paciai skaiciavimo apimciai atsitiktines paieskos metu daliniu zingsniu optimizavimas nepagerina galutinio rezultato. Il. 2, bibl. 8, lent. 3 (anglu kalba; santraukos anglu ir lietuviu k.).