Modeling of level of defects in electronics systems/Elektroniniu sistemu defektyvumo modeliavimas

This publication is about continuous between-operational control main probabilities characteristics modelling techniques for multilevel ES, when separate independent parameters defect level probabilities distributions are set (known) in chosen control schematics. Made ES defect level probability density direct and reverse transformations models by separate parameter levels densities transformations. Offered to use approximated models instead of exact whole ES defect level because of complicated process of integration and models get more simple expressions. Ill. 1, bibl. 7 (in English; abstracts in English, Russian and Lithuanian). Pateikta metodika daugiaparametriu ES tarpoperacines kontroles pagrindinems tikimybinems charakteristikoms modeliuoti, kai yra pateikti atskiru nepriklausomu parametru defektingumo lygiu tikimybiu skirstiniai. Isbrokuotu ES srautai grazinami i gamybos procesa regeneruoti, o klasifikavimo taisykles atskirose kontroles pakopose analogiskos, esant nepaneigtinoms ES klasifikavimo pirmos ir antros rusies klaidoms pagal atskirus parametrus. Pagal atskiru parametru defektingumo lygiu tankiu transformacijas sudaryti ES defektingumo lygio tikimybiu tankio tiesiogines ir atvirkstines transformaciju modeliai. Il. 1, bibl. 7 (anglu kalba; santraukos anglu, rusu ir lietuviu k.).