Verfahren zur Herstellung einer Messspitze für ein Rastersondenmikroskop sowie Messsonde mit nach diesem Verfahren hergestellter Messspitze
The invention relates to a method for producing a measuring tip for a scanning probe microscope, in which on an existing measuring tip for the corresponding microscope, at least some areas of which measuring tip are coated with diamond, at least one diamond needle is produced from the diamond coatin...
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| Format: | Patent |
| Sprache: | ger |
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| Zusammenfassung: | The invention relates to a method for producing a measuring tip for a scanning probe microscope, in which on an existing measuring tip for the corresponding microscope, at least some areas of which measuring tip are coated with diamond, at least one diamond needle is produced from the diamond coating, wherein said needle protrudes beyond the existing measuring tip. The application also relates to a measuring probe having a measuring tip produced according to said method. |
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