preferred CSL misorientation distribution in polycrystalline SrTiO

preferred CSL misorientation distribution in polycrystalline SrTiO

Electron backscattered diffraction is used to investigate the preferred CSL (coincidence site lattice) distribution of polycrystalline SrTiO₃ as a function of annealing times (1 h and 16 h). Comparison of the CSL misorientations suggests that the CSL boundary energy plays a role in the preferred gra...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of microscopy (Oxford) 2007, Vol.227 (3), p.292-297
Hauptverfasser: PARK, MYUNG-BEOM, SHIH, SHAO-JU, COCKAYNE, DAVID J.H
Format: Artikel
Sprache:eng
Schlagworte:
Coincidence site lattice
electron backscattered diffraction
misorientation
SrTiO
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Electron backscattered diffraction is used to investigate the preferred CSL (coincidence site lattice) distribution of polycrystalline SrTiO₃ as a function of annealing times (1 h and 16 h). Comparison of the CSL misorientations suggests that the CSL boundary energy plays a role in the preferred grain growth.
ISSN:0022-2720
1365-2818