INCREASED CALCULATION EFFICIENCY FOR STRUCTURED ILLUMINATION MICROSCOPY

The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relatesto capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enh...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LU, Bo, HEIBERG, Andrew Dodge, LANGLOIS, Robert Ezra, YOUNG, Andrew James
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relatesto capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enhanced resolution images from the subtiles. The enhanced resolution images can be combined into enhanced images and can be used in subsequent analysis steps. The technology disclosed includes logic to reduce computing resources required to produce an enhanced resolution image from structured illumination of a target. A method is described for producing an enhanced resolution image from images of a target captured under structured illumination. This method applies one or more transformations to non-redundant data and then recovers redundant data from the non-redundant data after the transformations.