ORGANIC PRECLEAN FOR IMPROVING VAPOR PHASE WAFER ETCH UNIFORMITY

A method for achieving greater uniformity and control in vapor phase etching of silicon, silicon oxide layers and related materials associated with wafers used for semiconductor devices comprises the steps of first cleaning the wafer (3) surface to remove organics, followed by vapor phase etching. A...

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Hauptverfasser: KAO, DAH-BIN, DELARIOS, JOHN, M, MANRIQUEZ, RALPH, K, MCNEILLY, MICHAEL, A, NOBINGER, GLENN, L, KRUSELL, WILBUR, C
Format: Patent
Sprache:eng
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