ON-CHIP TEST TONE GENERATOR FOR BUILT-IN SPUR TESTING

An apparatus is disclosed that implements an on-chip test tone generator for built-in spur testing. In an example aspect, the apparatus includes an integrated circuit with a test tone generator, at least one reference signal generator, and at least one signal propagation path. The test tone generato...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	XU, Rui, PAN, Dongling, TANG, Yiwu, HAO, Shilei
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY TRANSMISSION
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