DEVICE AND METHOD FOR INSPECTION OF A SUBSTANTIALLY TRANSPARENT SUBSTRATE

The invention relates to a device and a method for enabling inspection of a substantially transparent substrate. The device comprises thereto a housing and a light source, and method enables analyzing of a substantially transparent substrate positioned within the housing in an effective manner. L�...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	TER MEULEN, Jan Matthijs, VELDHUIZEN, Leon Willem
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	APPARATUS SPECIALLY ADAPTED THEREFOR CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MATERIALS THEREFOR MEASURING ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to a device and a method for enabling inspection of a substantially transparent substrate. The device comprises thereto a housing and a light source, and method enables analyzing of a substantially transparent substrate positioned within the housing in an effective manner. L'invention concerne un dispositif et un procédé pour permettre l'inspection d'un substrat sensiblement transparent. Le dispositif comprend un boîtier et une source de lumière, et un procédé permet l'analyse d'un substrat sensiblement transparent positionné à l'intérieur du boîtier d'une manière efficace.